X-ray & Electron Metallography

Course Name: 

X-ray & Electron Metallography (MT263)


B.Tech (MME)




Programme Core (PC)

Credits (L-T-P): 

(3-1-0) 4


Stereographic projections, generation, absorption and detection of X-rays; intensity of diffracted beam, - Scherrer formula; Laue, rotating, powder methods, Debye-Scherrer technique, focusing technique, pin hole technique, diffractometer, crystal structure, indexing cubic and non-cubic patterns, precise lattice parameter, single crystal orientation; order-disorder transformation, grain size, texture, solvus line, chemical analysis: qualitative, quantitative; TEM Vs optical microscope, electron - matter interaction, image formation, specimen preparation, reciprocal lattice, indexing SAD patterns; SEM: modes, magnification, contrast, EPMA, FIM, STM, EDAX.


B. D.Cullity, Elements of X-Ray Diffraction, Addison Wesley, 1977.
R. E. Smallman & K. M.B. Ashbee, Modern Metallography, 1966.


Metallurgical and Materials Engineering

Contact us

Prof. Anandhan Srinivasan, Head
Department of MME, NITK, Surathkal
P. O. Srinivasnagar, Mangaluru - 575 025
Karnataka, India.
  • Hot line: +91-0824-2474000 Extn. 3050

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