Materials Characterisation

Course Name: 

Materials Characterisation (ML701)


M.Tech. in Materials Engineering




Programme Core (PC)

Credits (L-T-P): 

(3-1-0) 4


X-RD techniques: Single crystal orientation, Texture studies, Lattice parameter, Chemical analysis, Stress analysis. TEM: Theories of contrast in crystal, electron diffraction, SAD patterns, lattice defects, precipitates, second phases, specimen preparations. SEM: Electron - specimen interactions; modes of working, X-ray, auger induced conductivity, high resolution scanning transmission microscopy. Field ion and field emission microscope.


P. G. Grundy and G. A. Jones, Electron Microscopy in Study of Materials, Edward Ernold, 1976.
B. D. Cullity, Elements of X-ray Diffraction, Addison - Wesley Publications, 1978.
P. E. J. Flewitt & R. K. Wild, Physical Methods of Materials Characterization, IOP, 1994 Publishing Ltd.
Metals Hand Book, Vo.10, ASM, Metals Park, Ohio, 1986.


Metallurgical and Materials Engineering

Contact us

Dr. Udaya Bhat K, Head
Department of MME, NITK, Surathkal
P. O. Srinivasnagar, Mangalore - 575 025
Karnataka, India.

  • Hot line: +91-0824-2474000 Extn. 3050

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