Materials Characterisation

Course Name: 

Materials Characterisation (ML701)

Programme: 

M.Tech. in Materials Engineering

Semester: 

First

Category: 

Programme Core (PC)

Credits (L-T-P): 

(3-1-0) 4

Content: 

X-RD techniques: Single crystal orientation, Texture studies, Lattice parameter, Chemical analysis, Stress analysis. TEM: Theories of contrast in crystal, electron diffraction, SAD patterns, lattice defects, precipitates, second phases, specimen preparations. SEM: Electron - specimen interactions; modes of working, X-ray, auger induced conductivity, high resolution scanning transmission microscopy. Field ion and field emission microscope.

References: 

P. G. Grundy and G. A. Jones, Electron Microscopy in Study of Materials, Edward Ernold, 1976.
B. D. Cullity, Elements of X-ray Diffraction, Addison - Wesley Publications, 1978.
P. E. J. Flewitt & R. K. Wild, Physical Methods of Materials Characterization, IOP, 1994 Publishing Ltd.
Metals Hand Book, Vo.10, ASM, Metals Park, Ohio, 1986.

Department: 

Metallurgical and Materials Engineering
 

Contact us

Dr. Udaya Bhat K, Head
Department of MME, NITK, Surathkal
P. O. Srinivasnagar, Mangalore - 575 025
Karnataka, India.

  • Hot line: +91-0824-2474000 Extn. 3050

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