Materials Characterisation
Course Name:
Materials Characterisation (ML701)
Programme:
M.Tech. in Materials Engineering
Semester:
First
Category:
Programme Core (PC)
Credits (L-T-P):
(3-1-0) 4
Course modules and teaching hours:
X-RD techniques: Single crystal orientation, Texture studies, Lattice parameter, Chemical analysis, Stress analysis. TEM: Theories of contrast in crystal, electron diffraction, SAD patterns, lattice defects, precipitates, second phases, specimen preparations. SEM: Electron - specimen interactions; modes of working, X-ray, auger induced conductivity, high resolution scanning transmission microscopy. Field ion and field emission microscope.
References:
P. G. Grundy and G. A. Jones, Electron Microscopy in Study of Materials, Edward Ernold, 1976.
B. D. Cullity, Elements of X-ray Diffraction, Addison - Wesley Publications, 1978.
P. E. J. Flewitt & R. K. Wild, Physical Methods of Materials Characterization, IOP, 1994 Publishing Ltd.
Metals Hand Book, Vo.10, ASM, Metals Park, Ohio, 1986.
Department:
Metallurgical and Materials Engineering